Semiconductor Applications

Compressed Air Drying & Pure Gases

Measurement
Brand
Model
Dewpoint
Michell Instruments

Concentration

Measurement
Brand
Model
KOH, CMP Slurry, H2O2 in CMP Slurry, Kl in CMP Slurry, SiC Slurry, etc
Fuji Ultrasonic
 
 

Continuous Emission Monitoring

Measurement
Brand
Model
Monitoring Perfluorinated Compounds (PFCs)
Protea
 

Controlled Environment

Measurement
Brand
Model
Relative Humidity (%RH)
Michell Instruments

Leak Detection

Measurement
Brand
Model
O2, LEL, CO, H2S
BW Technologies by Honeywell

Viscosity

Measurement
Brand
Model
Casein, Photo Resist, Fluorescent Slurry
Fuji Ultrasonic
 

Wet Etching

Measurement
Brand
Model
Hydrofluoric Acid
Applied Analytics Inc